Download our data sheet on custom metrology discovery service. Lumetrics engineering discovery service provides solutions to complex metrology challenges:
Our patented interferometric thickness measurement solution, the OptiGauge® designed to measure the absolute thickness of any translucent or light-absorbing materials. It provides real-time measurement of single or multi-layer materials
Our wavefront measurement systems that are ideal for analyzing optics-related products and materials from contacts lenses, intraocular lenses to laser beam analysis, surface measurement and phase parameters.