The OG-2000 instrument is based on the time-domain low-coherence interferometry. This technology enables absolute thickness measurement of any material, which is transparent or partially transparent to the measurement light. The OG-2000 uses infrared light with the center wavelength of approximately 2 microns. The OG-2000 is designed to measure specialty and rare materials, such as Germanium, Gallium Arsenide, Beryllium, nano-composite optical ceramics and others. Conventional glass and plastic materials can be measured as well. Our patented technology allows for fast real-time measurements, and can be used for on-line process control as well as off-line quality control purposes.